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1. Title: Extended defects in semiconductors : electronic properties, device effects and structures / D.B. Holt, B.G. Yacobi.
Author: Holt, D.B.
Publication: Cambridge University Press, Cambridge ; New York : 2007.
2. Title: Imperfections and impurities in semiconductor silicon / K. V. Ravi.
Author: Ravi, K. V., 1940-
Publication: Wiley, New York : c1981.
3. Title: Point defects in semiconductors / M. Lannoo, J. Bourgoin.
Springer series in solid state sciences ;
Author: Lannoo, M. (Michel), 1942-
Publication: Springer-Verlag, Berlin ; New York : 1981-1983.
4. Title: Positron annihilation in semiconductors : defect studies / R. Krause-Rehberg, H.S. Leipner.
Springer series in solid-state sciences,
Author: Krause-Rehberg, R. (Reinhard), 1955-
Publication: Springer, Berlin ; New York : c1999.
5. Title: Photoinduced defects in semiconductors / David Redfield and Richard H. Bube.
Cambridge studies in semiconductor physics and microelectronic engineering ;
Author: Redfield, David.
Publication: Cambridge University Press, Cambridge ; New York : 1996.
6. Title: Metal impurities in silicon-device fabrication / Klaus Graff.
Springer series in materials science ;
Springer series in materials science ;
Author: Graff, Klaus, 1931-
Publication: Springer-Verlag, Berlin ; New York : c1995.
7. Title: New methods for modelling processes within solids and at their surfaces / edited by C.R.A. Catlow, A.M. Stoneham, and Sir John Meurig Thomas.
Oxford science publications.
Philosophical transactions of the Royal Society of London.
Publication: Royal Society ; Oxford University Press, London : Oxford ; New York : 1993.
8. Title: The electrical characterization of semiconductors : measurement of minority carrier properties / J.W. Orton and P. Blood.
Techniques of physics ;
Author: Orton, J. W. (John Wilfred)
Publication: Academic Press, London ; San Diego : c1990.
 
 
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