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Title:
IEEE standard test procedures for semiconductor charged-particle detectors/ sponsor Nuclear Instruments and DetctorsCommittee of the IEEE Nuclear and Plasma Sciences Society.
ANSI/IEEE std 300-1982
Publisher:
IEEE,
Publication Place:
New York:
Subject:
Electric engineering
Semiconductor nuclear counters
Particle acceletators
Series:
ANSI/IEEE std 300-1982
Physical Description:
28p.
Publication Date:
1982.
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Yarmouk
General
TK9 .I33 STD300 1982
Normal Circulation
Available
الكتاب موجود في الطابق الثالث
YU94551
Book