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Title: Advanced Computing in Electron Microscopy by Earl J. Kirkland.
Main Entry: Kirkland, Earl J.
SpringerLink (Online service)
Publisher: Springer US,
Publication Date: 2010.
Publication Place: Boston, MA :
ISBN: 9781441965332
Subject: Computer engineering.
Surfaces (Physics).
Materials science.
Characterization and Evaluation of Materials.
Electrical engineering.
Contents: <P>Introduction -- The transmission electron microscope -- Linear image approx -- Sampling and the fast fourier transform -- Calculating images of thin specimens -- Calculating images of thick specimens -- Some worked examples -- Program details -- App. A: Atomic potentials and scattering factors -- App. B: The fourier projection theorem -- App. C: Bilinear interpolation -- App. D: 3D perspective view.</P>.
Related Records: Springer eBooks
Printed edition: 9781441965325
Cover Image: http://images.amazon.com/images/P/9781441965332.jpg

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JUST Main Library Electronic Resources TA404.6 No Circulation Available Online -574606 Book