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Title: Electron beam testing technology / edited by John T.L. Thong.
Microdevices
Main Entry: Thong, John T. L.
Publisher: Plenum Press,
Publication Date: c1993.
Publication Place: New York :
ISBN: 0306443600
Subject: SEMICONDUCTORS -- TESTING.
Electron beams -- Industrial applications.
Scanning electron microscopes.
Series: Microdevices
Cover Image:

http://images.amazon.com/images/P/0306443600.jpg

Agency:	Collection:	Call No.:	Item Type:	Status:	Copy:	Barcode:	Media Type:
Al Al-Bayt University	General	TK7871.85.E426	Normal Circulation	Available		AB0067837	Book
Muta Main Library	General	621.381548 ELE	Normal Circulation	Available	1	MU20055827	Book
Muta Main Library	General	621.381548 ELE	Normal Circulation	Available	2	MU20055828	Book