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Title:
Built-in-Self-Test and Digital Self-Calibration for RF SoCs by Sleiman Bou-Sleiman, Mohammed Ismail.
SpringerBriefs in Electrical and Computer Engineering
SpringerBriefs in Electrical and Computer Engineering
Author:
Bou-Sleiman, Sleiman. author.
Ismail, Mohammed. author.
SpringerLink (Online service)
General Notes:
Introduction and Motivation -- Radio Systems Overview: Architecture, Performance and Built-in-Test -- Efficient Testing for RF SoCs -- RF Built-in-Self-Test -- RF Built-in-Self-Calibration -- Conclusions.
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Publisher:
Springer New York,
Publication Place:
New York, NY :
ISBN:
9781441995483
Subject:
Engineering.
Systems engineering.
Engineering.
Circuits and Systems.
Signal, Image and Speech Processing.
Electronic Circuits and Devices.
Series:
SpringerBriefs in Electrical and Computer Engineering
SpringerBriefs in Electrical and Computer Engineering
Contents:
Introduction and Motivation -- Radio Systems Overview: Architecture, Performance and Built-in-Test -- Efficient Testing for RF SoCs -- RF Built-in-Self-Test -- RF Built-in-Self-Calibration -- Conclusions.
Physical Description:
XVII, 89p. 70 illus. online resource.
Electronic Location:
http://dx.doi.org/10.1007/978-1-4419-9548-3
Publication Date:
2012.
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